DocumentCode :
2308284
Title :
Perturbative solution for the scattering from multilayered structure with rough boundaries
Author :
Imperatore, Pasquale ; Iodice, Antonio ; Riccio, Daniele
Author_Institution :
Dipt. di Ing. Elettron. e delle Telecomun., Univ. di Napoli "Federico II", Naples
fYear :
2008
fDate :
11-14 March 2008
Firstpage :
1
Lastpage :
4
Abstract :
The objective of this paper is to investigate analytically the fully polarimetric electromagnetic wave scattering and emission from a three-dimensional layered structure with N-rough interfaces in the framework of SPM method. Assuming that deviations and slopes - with respect to the reference mean plane - exhibited by rough interfaces are small enough, we firstly perform a perturbative expansion of the fields in the rough-interfaces layered structure, following the classical scheme employed to deal with a rough surface. Subsequently, by using effectively the concept of generalized reflection/transmission coefficients, the unknown expansion coefficients of scattered wave propagating upward in the upper half-space are derived via a recursive method. This approach can be also applied to the evaluation of the second-order contribution, opening the way to the accurate calculation of thermal emission from complex layered structure.
Keywords :
electromagnetic wave polarisation; electromagnetic wave scattering; geophysical techniques; perturbation theory; polarimetry; rough surfaces; 3D layered structure; SPM method; multilayered structure scattering; perturbative solution; polarimetric electromagnetic wave scattering; rough boundaries; Electromagnetic analysis; Electromagnetic scattering; Nonhomogeneous media; Ocean temperature; Radar scattering; Reflection; Rough surfaces; Scanning probe microscopy; Sea surface; Surface roughness; Layered media; Perturbation Methods; Sub-Surface Sensing; Surface & Volume Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Radiometry and Remote Sensing of the Environment, 2008. MICRORAD 2008
Conference_Location :
Firenze
Print_ISBN :
978-1-4244-1986-9
Electronic_ISBN :
978-1-4244-1987-6
Type :
conf
DOI :
10.1109/MICRAD.2008.4579482
Filename :
4579482
Link To Document :
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