Title :
Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration
Author :
Cho, Minki ; Sathe, Nikhil ; Raychowdhur, Arijit ; Mukhopadhyay, Saibal
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We present adaptive spatiotemporal power migration (ASTPM) for burn-in of many core chips. ASTPM adapts the number of simultaneously stressed cores and dynamically varies their location to prevent thermal runaway, improve test-quality, and optimize burn-in time.
Keywords :
multiprocessing systems; adaptive spatiotemporal power migration; burn-in test; many-core processors;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699205
