DocumentCode :
2308777
Title :
Performance of bifacial MIS-inversion layer solar cells encapsulated in novel albedo collecting modules
Author :
Jaeger, K. ; Bende, G. ; Hoffmann, W. ; Hezel, R.
Author_Institution :
NUKEM GmbH, Alzenau, Germany
fYear :
1993
fDate :
10-14 May 1993
Firstpage :
1235
Lastpage :
1239
Abstract :
It is the purpose of this work to demonstrate the first experimental results obtained on novel albedo collecting modules made with thin-silicon bifacially sensitive MIS inversion layer solar cells. The bifacial cells were fabricated on solar grade CZ-grown silicon substrates (0.5-1.7 ohm) of only 100 μm in thickness. By the application of a novel casting module technique, frameless bifacial flat plate modules, narrow in width and hence specially designed in order to efficiently collect the albedo, were fabricated. As an important result, outdoor measurements revealed that by using a simple arrangement of white back diffusers (i.e. a white-painted plate in parallel with the module), the output power of the elongated bifacial modules is increased by 33% as compared to monofacial modules. This consequently leads to a reduction of the Wp-costs for the albedo collecting modules
Keywords :
albedo; casting; crystal growth from melt; economics; elemental semiconductors; metal-insulator-semiconductor devices; semiconductor device manufacture; semiconductor device testing; semiconductor growth; semiconductor thin films; silicon; solar cells; 0.5 to 1.7 ohm; 100 mum; CZ-grown substrates; Si; albedo collecting modules; bifacial MIS-inversion layer solar cells; casting module technique; costs; encapsulation; fabrication; frameless bifacial flat plate modules; outdoor measurements; output power; performance; semiconductor; white back diffusers; Casting; Costs; Design optimization; Fabrication; Lighting; Photovoltaic cells; Photovoltaic systems; Power generation; Silicon; Solar power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
Type :
conf
DOI :
10.1109/PVSC.1993.346945
Filename :
346945
Link To Document :
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