Title :
Large-displacement modelling and simulation of micromechanical electrostatically driven resonators using the harmonic balance method
Author :
Veijola, T. ; Mattila, T. ; Jaakkola, O. ; Kiihamaki, J. ; Lamminmaki, T. ; Oja, A. ; Ruokonen, K. ; Seppa, H. ; Seppala, P. ; Tittonen, I.
Author_Institution :
Dept. of Electr. & Commun. Eng., Helsinki Univ. of Technol., Espoo, Finland
Abstract :
Nonlinearities in electrostatically driven micromechanical resonators are studied with circuit simulations. Models for the resonators are built of elementary electrical equivalent-circuit blocks constructed of nonlinear voltage-controlled current and charge sources. They are simulated with the harmonic balance method in the RF-simulation program APLAC. Spring softening effects due to the capacitive transducer and spring hardening effects due to the resonator´s third order spring coefficient are demonstrated by simulations. For verification, a model for a micromachined high-Q beam resonator structure has been constructed, and its measured large-displacement frequency-domain transfer characteristics are successfully reproduced by model simulations.
Keywords :
digital simulation; electrical engineering computing; electrostatic devices; equivalent circuits; micromechanical resonators; modelling; APLAC; RF simulation program; capacitive transducer; equivalent-circuit blocks; harmonic balance method; large-displacement frequency-domain transfer characteristics; large-displacement modelling; micromachined high-Q beam resonator structure; micromechanical electrostatically driven resonators; model simulations; nonlinear voltage-controlled charge sources; nonlinear voltage-controlled current sources; nonlinearities; spring hardening effects; spring softening effects; third order spring coefficient; Capacitance; Capacitors; Circuit simulation; Damping; Displacement control; Micromechanical devices; Power harmonic filters; Springs; Transducers; Voltage control;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.860894