• DocumentCode
    2309001
  • Title

    Increasing PRPG-based compression by delayed justification

  • Author

    Wohl, P. ; Waicukauski, J.A. ; Finklea, T.

  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Scan testing and scan compression have become key components for reducing test cost, and most high-compression schemes are based on linear, sequential compressors e.g., pseudo-random pattern generators (PRPG). We present a novel technique to increase PRPG-based compression by modifying test generation so that justification of certain decision nodes is delayed and merged with PRPG seed computation. Our method does not affect test coverage or diagnosis, requires no hardware support, and can be applied to any linear compression scheme. Results on industrial designs demonstrate consistent increase in compression.
  • Keywords
    automatic test pattern generation; delays; fault diagnosis; integrated circuit testing; ATPG-based method; PRPG seed computation; PRPG-based compression; automatic test pattern generation; decision node justification; delayed justification; fault test; industrial designs; linear compression scheme; linear sequential compressors; pseudorandom pattern generators; scan compression; scan testing; test cost reduction; test generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699226
  • Filename
    5699226