DocumentCode
2309001
Title
Increasing PRPG-based compression by delayed justification
Author
Wohl, P. ; Waicukauski, J.A. ; Finklea, T.
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
1
Lastpage
10
Abstract
Scan testing and scan compression have become key components for reducing test cost, and most high-compression schemes are based on linear, sequential compressors e.g., pseudo-random pattern generators (PRPG). We present a novel technique to increase PRPG-based compression by modifying test generation so that justification of certain decision nodes is delayed and merged with PRPG seed computation. Our method does not affect test coverage or diagnosis, requires no hardware support, and can be applied to any linear compression scheme. Results on industrial designs demonstrate consistent increase in compression.
Keywords
automatic test pattern generation; delays; fault diagnosis; integrated circuit testing; ATPG-based method; PRPG seed computation; PRPG-based compression; automatic test pattern generation; decision node justification; delayed justification; fault test; industrial designs; linear compression scheme; linear sequential compressors; pseudorandom pattern generators; scan compression; scan testing; test cost reduction; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699226
Filename
5699226
Link To Document