Title :
A unified approach for successive release of a software under two types of imperfect debugging
Author :
Singh, Ompal ; Kapur, P.K. ; Shrivastava, A.K. ; Das, Lipsa
Author_Institution :
Dept. of Operational Res., Univ. of Delhi, New Delhi, India
Abstract :
The competitive essence of market and the rapid turnover in the technology is shrinking the life of software. A software with bounded functionality cannot survive the high tides of contention. This raise the need for multiple up gradations of the software and consequently the customary approach towards software development process as observed in practice by most of the software firms today is iterative in nature. They are putting in lots of efforts to mark their presence in the market through periodic functional enrichment. But, functional enhancement adds to the existing complexity of the software and at the same time higher prospects of error. On the grounds of increasing complexity and partial insight into the software, the testing team may not prove to be competent enough to perfectly fix the faults by removing or correcting them after failure is detected. Hence, a fault might go unperceived by surviving the selected test cases performed by the testing unit resulting in a phenomenon termed as imperfect debugging. Another possible scenario is when an error get replaced by another one leading to error generation. In this paper we have developed a two stage fault detection and correction model in the presence of two types of imperfect debugging for multiple releases of a software. The proposed model has been validated on real data set for four releases.
Keywords :
program debugging; program testing; software fault tolerance; imperfect debugging; multiple software release; software complexity; software development process; software testing unit; two stage fault correction model; two stage fault detection model; Software; Software measurement; Imperfect Debugging; Multi Release; Non-Homogeneous Poisson Process (NHPP); Software reliability Growth Model (SRGM); Unified Approach;
Conference_Titel :
Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), 2014 3rd International Conference on
Conference_Location :
Noida
Print_ISBN :
978-1-4799-6895-4
DOI :
10.1109/ICRITO.2014.7014695