• DocumentCode
    2309160
  • Title

    The data acquisition and calibration system for the ATLAS Semiconductor Tracker

  • Author

    Barber, Tom

  • Author_Institution
    Univ. of Cambridge, Cambridge, UK
  • fYear
    2009
  • fDate
    10-15 May 2009
  • Firstpage
    465
  • Lastpage
    471
  • Abstract
    The Semiconductor Tracker (SCT) data acquisition (DAQ) system has been built to calibrate, configure, and control the approximately six million front-end channels of the ATLAS silicon strip detector. It provides a synchronized bunch crossing clock to the frontend modules, communicates first-level triggers to the front-end chips, and transfers information about hit strips to the ATLAS high-level trigger system. The system has been used extensively for calibration and quality assurance during SCT barrel and end-cap assembly and for performance confirmation tests after transport of the barrels and end-caps to CERN. Operating in data-taking mode, the DAQ has recorded millions of synchronously-triggered events during commissioning tests including cosmic ray triggered events both in standalone and ATLAS-wide mode. In this paper we describe the components of the data acquisition system, discuss its operation in calibration and data-taking modes and present some detector performance results from these tests.
  • Keywords
    calibration; cosmic ray apparatus; data acquisition; nuclear electronics; position sensitive particle detectors; readout electronics; silicon radiation detectors; trigger circuits; ATLAS semiconductor tracker; CERN; DAQ; SCT; calibration system; communicates first-level triggers; cosmic ray trigger; data acquisition; front-end channels; high-level trigger system; read-out electronics; silicon strip detector; Calibration; Clocks; Control systems; Data acquisition; Detectors; Quality assurance; Silicon; Strips; Synchronization; System testing; Data Acquisition; Silicon detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real Time Conference, 2009. RT '09. 16th IEEE-NPSS
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4454-0
  • Type

    conf

  • DOI
    10.1109/RTC.2009.5321563
  • Filename
    5321563