Title :
Structural approach for built-in tests in RF devices
Author :
Mannath, Deepa ; Webster, Dallas ; Montano-Martinez, Victor ; Cohen, David ; Kush, Shai ; Ganesan, Thiagarajan ; Sontakke, Adesh
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Production testing of today´s RF SoCs does not require expensive conventional tests. We propose a set of defect based tests for the RF/Analog sections, based on our analysis of defects that occur in a modern RFCMOS process.
Keywords :
built-in self test; radiofrequency integrated circuits; semiconductor device testing; system-on-chip; RF device; RFCMOS process; SoC; built-in test; defect based test; production testing; structural approach;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699241
