DocumentCode
2309243
Title
Quantifying Artifacts of Virtualization: A Framework for Mirco-Benchmarks
Author
Matthews, Chris ; Coady, Yvonne ; Neville, Stephen
Author_Institution
Dept. of Comput. Sci., Univ. of Victoira, Victoria, BC
fYear
2009
fDate
26-29 May 2009
Firstpage
1079
Lastpage
1084
Abstract
One of the novel benefits of virtualization is its ability to emulate many hosts with a single physical machine. This approach is often used to support at-scale testing for large-scale distributed systems. To better understand the precise ways in which virtual machines differ from their physical counterparts, we have started to quantify some of the timing artifacts that appear to be common to two modern approaches to virtualization. Here we present several systematic experiments that highlight four timing artifacts, and begin to decipher their origins within virtual machine implementations. These micro-benchmarks serve as a means to better understand the mappings that exist between virtualized and real-world testing infrastructure. Our goal is to develop a reusable framework for micro-benchmarks that can be customized to quantify artifacts associated with specific cluster configurations and workloads. This type of quantification can then be used to better anticipate behavioral characteristics at-scale in real settings.
Keywords
benchmark testing; distributed processing; program testing; virtual machines; cluster configuration; large-scale distributed system; mircobenchmark framework; real-world testing infrastructure; reusable framework; software testing; virtual machine; virtualization framework; Application virtualization; Control systems; Large-scale systems; Platform virtualization; System testing; Timing; Virtual machine monitors; Virtual machining; Virtual manufacturing; Voice mail; Clustering; Emulation; Virtualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Information Networking and Applications Workshops, 2009. WAINA '09. International Conference on
Conference_Location
Bradford
Print_ISBN
978-1-4244-3999-7
Electronic_ISBN
978-0-7695-3639-2
Type
conf
DOI
10.1109/WAINA.2009.118
Filename
5136795
Link To Document