• DocumentCode
    2309267
  • Title

    Reliability Assurance of RAID Storage Systems for a Wide Range of Latent Sector Errors

  • Author

    Iliadis, Ilias ; Xiao-Yu Hu

  • Author_Institution
    IBM Zurich Res. Lab., Ruschlikon
  • fYear
    2008
  • fDate
    12-14 June 2008
  • Firstpage
    10
  • Lastpage
    19
  • Abstract
    The low-cost disk drives, which are increasingly being adopted in today´s data storage systems, have higher capacity but lower reliability, which leads to more frequent rebuilds and to a higher risk of unrecoverable or latent media errors. An intra-disk redundancy scheme has been proposed to cope with such errors and enhance the reliability of RAID systems. Empirical field results recently reported in the literature, however, suggest that the extent to which unrecoverable media errors occur is higher than the data sheet specifications provided by the disk manufacturers. Our results demonstrate that the reliability improvement due to intradisk redundancy is adversely affected because of the increase in the number of unrecoverable errors. We demonstrate that, by revising the parameter choice of the intradisk redundancy scheme, we can obtain essentially the same reliability as that of a system operating without unrecoverable sector errors. The I/O and throughput performance are evaluated by means of analysis and event-driven simulations. The effects of the spatial locality of errors and of the error-burst length distribution on the system reliability are also investigated.
  • Keywords
    RAID; discrete event simulation; reliability; RAID storage systems; data storage systems; error-burst length distribution; event-driven simulations; intra-disk redundancy scheme; latent sector errors; low-cost disk drives; reliability assurance; spatial error locality; unrecoverable errors; Analytical models; Data storage systems; Discrete event simulation; Disk drives; Error correction; Manufacturing; Performance analysis; Protection; Redundancy; Throughput; MTTDL; RAID; Unrecoverable or latent sector errors; reliability analysis; stochastic modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Networking, Architecture, and Storage, 2008. NAS '08. International Conference on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-0-7695-3187-8
  • Type

    conf

  • DOI
    10.1109/NAS.2008.20
  • Filename
    4579556