Title :
ADC linearity testing method with single analog monitoring port
Author :
Kawachi, Tomohiro ; Irie, Koichi
Author_Institution :
Yokogawa Electr. Corp., Inc., Tokyo, Japan
Abstract :
We propose an ADC linearity testing method with a single analog monitoring port. This method enables direct measurement of code transitions without clocking and digital signal processing. We analyzed code transition measurement errors caused by additional monitoring circuits, and verified that the errors are less than 0.1LSB with simulations. We applied the proposed testing method to laser wafer trimming (LWT) for ADC linearity improvement, and achieved integral non-linearity (INL) 0.26LSB and differential non-linearity (DNL) 0.30LSB respectively.
Keywords :
analogue integrated circuits; analogue-digital conversion; integrated circuit measurement; integrated circuit testing; ADC linearity testing; code measurement error; code transition; differential nonlinearity; integral nonlinearity; laser wafer trimming; monitoring circuit; single analog monitoring port;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699244
