DocumentCode
2309320
Title
Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing
Author
Xin He ; Malaiya, Y. ; Ayasumana, Anura P J ; Parker, Kenneth P. ; Hird, Stephen
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
1
Lastpage
10
Abstract
Capacitive Leadframe Testing is capable of detecting open solder defects in Printed Circuit Boards (PCB). Principal Component Analysis (PCA)-based approach has been shown to be effective in identifying outlier devices using Capacitive Leadframe Testing measurements. In practice, when a sense plate orientation is shifted or tilted, the resulting measurement variation makes detecting outliers harder. Approaches are introduced to compensate for the `abnormal´ measurements due to sense-plate variations. A PCA based technique is developed to estimate the relative amount of tilt and shift in sense plates. Such estimates can be used to compensate for mechanical misalignments. It can also isolate the misalignment related information from the defect related information in the data. The effectiveness of this technique in the presence of the two common forms of mechanical variations is illustrated using experimental measurements from a laboratory setting. The approach is not sensitive to the order of pins, and as such, shows promise for detection of complex but systematic errors introduced by sense plate misalignments.
Keywords
measurement errors; principal component analysis; printed circuit testing; PCB testing; capacitive leadframe testing; measurement error; mechanical misalignment; mechanical variation; open solder defect; outlier device; principal component analysis-based compensation; printed circuit board; sense plate misalignment; sense plate orientation; sense plate variation; systematic error; Board testing; Capacitive open testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699249
Filename
5699249
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