• DocumentCode
    2309320
  • Title

    Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing

  • Author

    Xin He ; Malaiya, Y. ; Ayasumana, Anura P J ; Parker, Kenneth P. ; Hird, Stephen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Capacitive Leadframe Testing is capable of detecting open solder defects in Printed Circuit Boards (PCB). Principal Component Analysis (PCA)-based approach has been shown to be effective in identifying outlier devices using Capacitive Leadframe Testing measurements. In practice, when a sense plate orientation is shifted or tilted, the resulting measurement variation makes detecting outliers harder. Approaches are introduced to compensate for the `abnormal´ measurements due to sense-plate variations. A PCA based technique is developed to estimate the relative amount of tilt and shift in sense plates. Such estimates can be used to compensate for mechanical misalignments. It can also isolate the misalignment related information from the defect related information in the data. The effectiveness of this technique in the presence of the two common forms of mechanical variations is illustrated using experimental measurements from a laboratory setting. The approach is not sensitive to the order of pins, and as such, shows promise for detection of complex but systematic errors introduced by sense plate misalignments.
  • Keywords
    measurement errors; principal component analysis; printed circuit testing; PCB testing; capacitive leadframe testing; measurement error; mechanical misalignment; mechanical variation; open solder defect; outlier device; principal component analysis-based compensation; printed circuit board; sense plate misalignment; sense plate orientation; sense plate variation; systematic error; Board testing; Capacitive open testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699249
  • Filename
    5699249