• DocumentCode
    2309352
  • Title

    Board-level fault diagnosis using an error-flow dictionary

  • Author

    Zhaobo Zhang ; Zhanglei Wang ; Xinli Gu ; Chakrabarty, Krishnendu

  • Author_Institution
    ECE Dept., Duke Univ., Durham, NC, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Diagnosis of functional failures is critical for locating manufacturing defects, increasing yield, and reducing field returns. It is important to narrow down the defective module in a failed component during board-level diagnosis. In this paper, a generic fault-diagnosis method based on an error-flow dictionary is presented to identify the root cause of functional failures on a chip or board. Error propagation mimics actual dataflow in a circuit, thus it reflects the native (functional) mode of circuit operation. In contrast to conventional fault syndromes, error flow includes the failure information in terms of circuit functionality, which significantly facilitates the diagnosis of functional failures. In the proposed diagnosis procedure, error flow is first learned from a good circuit by intentionally inserting faults, and then the root cause of a failing circuit is determined by comparing the similarity between the pre-learned error flow and the error flow observed from the failing circuit. The similarity of two error flows is evaluated based on the length of the longest common subsequence in string matching. Results for an open-source RISC SoC and an industrial communication circuit highlight the effectiveness of the proposed method.
  • Keywords
    data flow analysis; electronic engineering computing; fault diagnosis; integrated circuit testing; reduced instruction set computing; system-on-chip; board-level fault diagnosis; chip; circuit functionality; circuit operation; dataflow; defective module; error propagation; error-flow dictionary; failing circuit; fault syndrome; functional failure diagnosis; manufacturing defect; open-source RISC SoC; string matching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699251
  • Filename
    5699251