Title :
Concurrent test planning
Author :
Van Wagenen, Bethany ; Seng, Edward
Author_Institution :
Teradyne, Inc., North Reading, MA, USA
Abstract :
Testing multiple device functions in parallel can yield significant test time and cost of test reductions. This paper discusses the planning process and algorithms required to realize an efficient and achievable concurrent test plan.
Keywords :
automatic test equipment; automatic test pattern generation; automatic test software; automatic test equipment; concurrent test planning; multiple device functions; parallel; planning algorithms; planning process; test reductions; test time;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699255
