• DocumentCode
    2309456
  • Title

    Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins

  • Author

    Clark, C.J. ; Dubberke, Dave ; Parker, Kenneth P. ; Tuthill, Bill

  • Author_Institution
    Intellitech Corp, Dover, NH, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins. Unidirectional and bidirectional self-monitoring pins may contain sufficient series termination resistance and low enough voltage swings such that shorts between two pins become resistively isolated from the receivers and therefore are undetected during wiring interconnect tests. Potential solutions to mitigate the problem are offered.
  • Keywords
    boundary scan testing; integrated circuit interconnections; integrated circuit testing; short-circuit currents; IEEE 1149.1 compliant self-monitoring pin; bidirectional self-monitoring pin; series termination resistance; undetected shorts; unidirectional self-monitoring pin; voltage swing; wiring interconnect test; 1149.1; Board Test; Boundary Scan; JTAG; Wire Interconnect; hysteresis; shorts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699259
  • Filename
    5699259