Title :
Commanded Test Access Port operations
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
This paper describes a method of enabling IEEE 1149.1 Test Access Ports to perform at-speed “Update & Capture” and “Shift & Capture” operations in response to command inputs.
Keywords :
IEEE standards; automatic testing; logic testing; IEEE 1149.1; shift & capture operation; test access port; update & capture operation;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699261
