• DocumentCode
    2309481
  • Title

    Commanded Test Access Port operations

  • Author

    Whetse, L.

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper describes a method of enabling IEEE 1149.1 Test Access Ports to perform at-speed “Update & Capture” and “Shift & Capture” operations in response to command inputs.
  • Keywords
    IEEE standards; automatic testing; logic testing; IEEE 1149.1; shift & capture operation; test access port; update & capture operation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699261
  • Filename
    5699261
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2309481