Title :
Low power compression of incompatible test cubes
Author :
Czysz, D. ; Mrugalski, G. ; Mukherjee, N. ; Rajski, J. ; Szczerbicki, P. ; Tyszer, J.
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.
Keywords :
automatic testing; data compression; power aware computing; deterministic clustering; flexible test application framework; incompatible test cubes; low power compression; power aware test scheme; scan loading; switching activity; test compression environment; trimodal test data decompressor;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699274
