DocumentCode
2309812
Title
Integration for innovation—Trends in test and Moore´s Law
Author
Truchard, James
Author_Institution
CEO and Co-founder, National Instruments, USA
fYear
2010
fDate
2-4 Nov. 2010
Firstpage
12
Lastpage
12
Abstract
Everyone is familiar with Moore´s Law, but have you taken time to think through the impact it should have on test instrumentation? The transistor has decreased in size by a factor of 2000, so why hasn´t your tester followed suit? There are many high-performance commercial technologies available to you today to help improve how effi ciently you test. Multicore processing, PCI Express, and FPGAs are all under-utilized in today´s test systems, and can increase the performance and lower the cost of automated test.
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2010 IEEE International
Conference_Location
Austin, TX, USA
ISSN
1089-3539
Print_ISBN
978-1-4244-7206-2
Type
conf
DOI
10.1109/TEST.2010.5699285
Filename
5699285
Link To Document