Title :
AXIe®: Open architecture test system standard
Author_Institution :
Test Evolution, Inc., Hopkinton, MA, USA
Abstract :
A new open architecture test system standard, AXIe® is introduced. A summary of the two initial standards is presented with a focus on explaining why a standard is needed, and detailing success metrics applicable to ATE testing, including the impact of AXIe® on cost of test.
Keywords :
automatic test equipment; standards; ATE testing; AXIe; open architecture test system standard; success metrics;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699293
