Title :
NSF research experiences for undergraduates summer projects: 1. Measuring electrical properties of polycrystalline films 2. Calibrating a spectral quantum efficiency system 3. Implementing an optical beam induced current (OBIC) system
Author :
Whitacre, Jay ; McNett, Kristina ; Miller, Brett ; Bohn, Randy G. ; Compaan, Alvin D.
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH, USA
Abstract :
Three undergraduate students participated in photovoltaics research at the University of Toledo in the summer of 1992 under the NSF-sponsored program Research Experiences for Undergraduates (REU). Highlights of their work are presented here. Their work all involved studies of polycrystalline thin film CdS/CdTe solar cells. One project involved electrical conductivity and Hall effect measurements of doped and undoped CdS and CdTe films on glass, the second project involved improving and calibrating both a spectral quantum efficiency system and a triple spectrometer used for Raman and photoluminescence work, and the third project involved implementing an optical beam induced current (OBIC) system
Keywords :
Hall effect; II-VI semiconductors; OBIC; cadmium compounds; calibration; education; electrical conductivity of crystalline semiconductors and insulators; electrical engineering; electronic engineering; photoluminescence; project engineering; reliability; semiconductor doping; semiconductor thin films; solar cells; spectrometers; CdS-CdTe; Hall effect; Raman spectroscopy; USA; calibration; doping; education; electrical conductivity; electrical properties; optical beam induced current; photoluminescence; photovoltaics research; polycrystalline films; projects; spectral quantum efficiency; thin film solar cells; triple spectrometer; undergraduate students; Conductive films; Conductivity measurement; Current measurement; Electric variables measurement; Glass; Hall effect; Optical films; Photovoltaic cells; Spectroscopy; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347027
