• DocumentCode
    2310053
  • Title

    Scan chain securization though Open-Circuit Deadlocks

  • Author

    Portolan, Michele ; Van Treuren, Bradford ; Goyal, Suresh

  • Author_Institution
    Bell Labs. Ireland, Dublin, Ireland
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.
  • Keywords
    design for testability; JTAG target; open circuit deadlock; scalable securization; scan chain securization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699300
  • Filename
    5699300
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2310053