Title :
Scan chain securization though Open-Circuit Deadlocks
Author :
Portolan, Michele ; Van Treuren, Bradford ; Goyal, Suresh
Author_Institution :
Bell Labs. Ireland, Dublin, Ireland
Abstract :
This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.
Keywords :
design for testability; JTAG target; open circuit deadlock; scalable securization; scan chain securization;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699300
