• DocumentCode
    2310084
  • Title

    Detecting and diagnosing open defects

  • Author

    Tran, Dat ; Winemberg, LeRoy ; Carder, Darrell ; Lin, Xijiang ; LeBritton, Joe ; Swanson, Bruce

  • Author_Institution
    Freescale Semicond., Austin, TX, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault model to supplement the others. The project consists of many parts that target specific types of known open defects.
  • Keywords
    automatic test pattern generation; fault diagnosis; integrated circuit testing; open defect detection; open defect diagnosis; open fault model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699303
  • Filename
    5699303
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2310084