• DocumentCode
    2310357
  • Title

    Welcome message

  • Author

    Press, Ron ; Volkerink, Erik

  • Author_Institution
    Mentor Graphics Corporation, USA
  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    It is our pleasure to welcome you to the 41st International Test Conference. ITC is the world´s premier conference dedicated to the communication and advancement of electronics test. We have compiled a comprehensive program for electronics test professionals including educational tutorials, new research and practical results within the papers, discussions between industry leaders in panels, a broad test of solution providers in the exhibit fl oor, and workshops for deep targeted discussions.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX, USA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699322
  • Filename
    5699322
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2310357