Author :
Press, Ron ; Volkerink, Erik
Author_Institution :
Mentor Graphics Corporation, USA
Abstract :
It is our pleasure to welcome you to the 41st International Test Conference. ITC is the world´s premier conference dedicated to the communication and advancement of electronics test. We have compiled a comprehensive program for electronics test professionals including educational tutorials, new research and practical results within the papers, discussions between industry leaders in panels, a broad test of solution providers in the exhibit fl oor, and workshops for deep targeted discussions.
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX, USA
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699322
