Title :
Approximate analytical modeling of current crowding effects in multi-turn spiral inductors
Author :
Kuhn, W.B. ; Ibrahim, N.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA
Abstract :
The effective series resistance of a multi-turn spiral inductor operating at high frequencies is known to increase dramatically above its DC value due to proximity-effect or current crowding. This phenomenon is difficult to analyze precisely and has generally required electromagnetic simulation for quantitative assessment. Current crowding is studied in this work through approximate analytical modeling and first order expressions are derived for predicting resistance as a function of frequency. The results are validated through electromagnetic simulation and with measured data taken from a spiral inductor implemented in a silicon-on-sapphire process.
Keywords :
MMIC; UHF integrated circuits; circuit simulation; inductors; integrated circuit modelling; lumped parameter networks; approximate analytical modeling; current crowding effects; effective series resistance; electromagnetic simulation; first order expressions; multi-turn spiral inductors; proximity-effect; silicon-on-sapphire process; Analytical models; Electrical resistance measurement; Electromagnetic analysis; Electromagnetic induction; Electromagnetic measurements; Frequency; Inductors; Predictive models; Proximity effect; Spirals;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.861041