• DocumentCode
    2310819
  • Title

    Development of novel immersion gold for electroless nickel immersion gold process (ENIG) in PCB applications

  • Author

    Chan, C.M. ; Tong, K.H. ; Leung, S.L. ; Wong, P.S. ; Yee, K.W. ; Bayes, M.W.

  • Author_Institution
    Dow Electron. Mater., Dow Chem. Co., Hong Kong, China
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Electroless nickel and immersion gold (ENIG) is one of the most common final finishes used in PCBs. ENIG surfaces exhibit excellent planarity, solderability and wire bondability and tolerate multiple lead free solder reflows during assembly processing. However, the price of gold has increased rapidly from around $400 US per troy ounce in 2004 to over $1200 US in 2010. This change has increased ENIG operating costs for PCB manufacturers. While many customers have considered operating their immersion gold baths at levels well below the normal product operating ranges, making this change without proper qualification may have a negative impact on ENIG coating performance. In order to avoid such risks, we have developed a new immersion gold product, designed to operate at lower gold concentration, while ensuring that performance characteristics, including deposition rate, the impact on the electroless nickel layer during the displacement reaction and the coverage of the final deposit, are maintained at the required levels.
  • Keywords
    lead bonding; printed circuit manufacture; soldering; ENIG; PCB applications; PCB manufacturers; assembly processing; electroless nickel immersion gold process; lead free solder reflows; novel immersion gold; solderability; wire bondability; Copper; Corrosion; Gold; Nickel; Soldering; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699468
  • Filename
    5699468