DocumentCode
2310819
Title
Development of novel immersion gold for electroless nickel immersion gold process (ENIG) in PCB applications
Author
Chan, C.M. ; Tong, K.H. ; Leung, S.L. ; Wong, P.S. ; Yee, K.W. ; Bayes, M.W.
Author_Institution
Dow Electron. Mater., Dow Chem. Co., Hong Kong, China
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
Electroless nickel and immersion gold (ENIG) is one of the most common final finishes used in PCBs. ENIG surfaces exhibit excellent planarity, solderability and wire bondability and tolerate multiple lead free solder reflows during assembly processing. However, the price of gold has increased rapidly from around $400 US per troy ounce in 2004 to over $1200 US in 2010. This change has increased ENIG operating costs for PCB manufacturers. While many customers have considered operating their immersion gold baths at levels well below the normal product operating ranges, making this change without proper qualification may have a negative impact on ENIG coating performance. In order to avoid such risks, we have developed a new immersion gold product, designed to operate at lower gold concentration, while ensuring that performance characteristics, including deposition rate, the impact on the electroless nickel layer during the displacement reaction and the coverage of the final deposit, are maintained at the required levels.
Keywords
lead bonding; printed circuit manufacture; soldering; ENIG; PCB applications; PCB manufacturers; assembly processing; electroless nickel immersion gold process; lead free solder reflows; novel immersion gold; solderability; wire bondability; Copper; Corrosion; Gold; Nickel; Soldering; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699468
Filename
5699468
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