Title :
Arrays to atoms: the evolution of characterization
Author :
Kazmerski, Lawrence L.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
Characterization is one important component of the photovoltaics research and development effort. It has supported the evolution of the technology, and measurement techniques have evolved in response to the technology´s needs. This paper highlights some important evaluation and verification techniques, covering macroscale through microscale characterization methods. Some emphasis is placed upon the nanoscale regime, in which the characterization and processing of semiconductors is leading to areas of atomic engineering of materials
Keywords :
nanotechnology; solar cells; atomic engineering; evaluation techniques; macroscale characterization; measurement techniques; microscale characterization; nanoscale regime; photovoltaics research; semiconductors processing; verification techniques; Atomic measurements; Capacitance measurement; Current measurement; Electron beams; Energy measurement; Force measurement; Loss measurement; Mass spectroscopy; Photovoltaic cells; Pulse measurements;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347087
