DocumentCode
2310955
Title
Compact thermal network model of the electro-thermal system
Author
Kim, Jung-Kyun ; Nam, Sung-Ki ; Nakayama, Wataru ; Lee, Sun-Kyu
Author_Institution
Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
The accurate prediction of operating temperatures of temperature sensitive electronic parts at the component, package, board, and system level CFD simulations has engaged the engineering community for a number of years. The primary challenge has been that near-exact physical models of such components (known as detailed thermal models, or DTMs) are difficult or implement directly in system designs due toe the wide disparity in length scales involved, which results in large computational inefficiencies. A compact thermal model (CTM) attempts to solve this problem by taking a detailed model and extracting an abstracted, far less grid intensive representation that is still able to preserve accuracy in predicting the temperatures at key points in the package, such as the junction. In this paper, we present a compact thermal network model to represent the multi dimensional heat flow system as a network based on the thermal interface material (TIM) measurement apparatus. In order to estimate the heat flow division on each heat transfer path, thermal impedance and temperature difference between junction node and adjacent node are used. This model also can be extended to estimate the thermal interface resistance in joints and heat transfer coefficient variation of the multidimensional heat flow system.
Keywords
computational fluid dynamics; heat transfer; interface phenomena; semiconductor device models; thermal management (packaging); CFD simulations; CTM; DTM; TIM measurement apparatus; adjacent node; compact thermal model; compact thermal network model; detailed thermal models; electro-thermal system; engineering community; grid intensive representation; heat flow division; heat transfer coefficient variation; heat transfer path; junction node; large computational inefficiency; length scales; multi dimensional heat flow system; multidimensional heat flow system; near-exact physical models; operating temperatures; system designs; temperature difference; temperature sensitive electronic parts; thermal impedance; thermal interface material; thermal interface resistance; Computational modeling; Finite element methods; Heating; Materials; Predictive models; Thermal analysis; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699477
Filename
5699477
Link To Document