• DocumentCode
    2310974
  • Title

    Design and fabrication of metal PCB based on the patterned anodizing for improving thermal dissipation of LED lighting

  • Author

    Lee, Moon-Ho ; Lee, Tae Jin ; Lee, Hye Jin ; Kim, Young-Joo

  • Author_Institution
    Dept. of Mech. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The improvement of thermal efficiency in the light emitting diode (LED) is one of challenging topics for the wide use of high brightness LED since the excessive heat generated in the LED junction may result in the thermally induced optical and mechanical failures. To enhance thermal reliability of high brightness LED lighting, it is important to not only use components with high thermal conductivity in LED package but also improve thermal flow to the heat sink through the metal print circuit board (MPCB) where bad thermal efficiency is caused by dielectric layer with lower thermal conductivity. This study focuses on the design and fabrication of the new structure of metal PCB based on the patterned anodizing to improve thermal dissipation. The patterned anodizing makes it possible to connect the lead frame of LED package to the metal substrate directly without any thermal loss through the dielectric layer. Thus, more efficient thermal management is expected in newly designed MPCB since total thermal resistance can be reduced. In this paper, we will be present the findings, which have been resulted from thermal simulation and measurement to demonstrate the thermal performance of newly designed MPCB.
  • Keywords
    heat sinks; light emitting diodes; lighting; printed circuit design; printed circuit manufacture; thermal conductivity; LED lighting; dielectric layer; heat sink; light emitting diode; mechanical failures; metal PCB design; metal PCB fabrication; metal print circuit board; patterned anodizing; thermal conductivity; thermal dissipation; thermal efficiency; thermal flow; thermal management; thermal measurement; thermal reliability; thermal simulation; thermally induced optical failures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699479
  • Filename
    5699479