Qualification testing procedures for amorphous silicon modules

Author

Ross, Robert ; Call, Jon ; Vogeli, Craig ; Nath, Rem

Author_Institution

United Solar Syst. Ltd., Troy, MI, USA

fYear

1993

fDate

10-14 May 1993

Firstpage

901

Lastpage

906

Abstract

The procedures and sequences of the tests used by United Solar Systems Corp. (USSC) to qualify photovoltaic module designs are described. Data is presented to show the actual testing conditions and the effects of the accelerated stress tests on module performance. Correlations between accelerated stress tests and field performance are discussed when relevant

Keywords

amorphous semiconductors; elemental semiconductors; life testing; semiconductor device testing; silicon; solar cells; stress analysis; United Solar Systems Corporation; a-Si solar modules; accelerated stress tests; amorphous silicon modules; bypass diode test; electrical isolation test; electrical performance test; field performance; flex test; hail-impact test; hot-spot tolerance test; humidity-freeze test; mechanical loading test; photovoltaic module designs; qualification testing procedures; salt-fog test; strain relief test; surface cut test; thermal cycle test; Amorphous silicon; Batteries; Manufacturing processes; Multichip modules; Photovoltaic systems; Qualifications; Solar power generation; Solar system; Stress; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE

Conference_Location

Louisville, KY

Print_ISBN

0-7803-1220-1

Type

conf

DOI

10.1109/PVSC.1993.347101

Filename

347101