DocumentCode
2311005
Title
Fabrication of multilayer interconnection materials and bonding film for high integration applications
Author
Yoo, Myong-Jae ; Park, Seong-Dae ; Lee, Woo Sung ; Hwang, Ha-kin
Author_Institution
Electron. Mater. & device Res. center, Korea Electron. Technol. Inst., Seongnam, South Korea
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
To meet the demands for increased integration and multi functions for multilayer electronic components the related materials and process technique for layer-to-layer interconnection have to be developed together. Using nano-, micro-sized metal powders and epoxy resins conductive via pastes have been formulated. Via conductance was measured before and after solder floating(288 °C) to observe the change rate after thermal shock. Thermal conductivity of fabricated paste was evaluated by making disk-type pressed specimens. As the results, the electrical conductivities of tested pastes showed the values of about 10-5 Ωcm. Trimodal pastes showed better solder shock resistance thanbimodal pastes. Thermal conductivities over 15 W/mK were obtained from several paste compositions. Also regarding higher integration demands bonding film was developed. Composite material composed of epoxy based resin with inorganic fillers was used due to low process cost, good processability, and low temperature curability. As a result bonding film with glass transition temperature over 170 °C, peel strength above 7N/cm and fine patterning of line space width of 15 μm was fabricated.
Keywords
bonding processes; conductive adhesives; electric admittance measurement; electrical conductivity; integrated circuit interconnections; materials preparation; multilayers; nanocomposites; nanoparticles; powders; resins; soldering; thermal conductivity; thermal shock; bonding film; composite material; conductive via paste; disk-type pressed specimens; electrical conductivity; epoxy resin; inorganic filler; layer-to-layer interconnection; microsized metal powder; multilayer electronic component; multilayer interconnection material fabrication; nanosized metal powder; shock resistance; solder floating; thermal conductivity; thermal shock; trimodal paste; via conductance measurement; Bonding; Conductivity; Films; Integrated circuit interconnections; Surface treatment; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699480
Filename
5699480
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