• DocumentCode
    2311016
  • Title

    A new tool for multijunction cell diagnostics-QE measurements under AM1 bias light

  • Author

    Hou, Jingya ; Fonash, S.J. ; Chen, Liangfan

  • Author_Institution
    Electron. Mater. & Processing Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    891
  • Lastpage
    895
  • Abstract
    The authors attempt to obtain a relatively simple diagnostic tool that can be used to optimize the efficiency of multijunction solar cells. This measurement should be able to pinpoint which sub-cell most needs improvement. In this report, they explore such a tool: the quantum efficiency at the maximum power point under AM1 light (AM1QE). They demonstrate the application of AM1QE-based guidelines with AMPS computer program simulations and show that the most substantial improvement from sub-cell thickness adjustments comes from the sub-cell which causes a peak in the AM1QE. They also show that this proposed AM1QE quantum efficiency measurement for multijunctions is a much more sensitive monitor of changes in a multijunction than the so-called color light bias quantum efficiency measurement
  • Keywords
    digital simulation; electronic engineering computing; p-n heterojunctions; power engineering computing; semiconductor device models; semiconductor device testing; software packages; solar cells; AM1 light; AM1QE; AMPS; computer program; diagnostic tool; efficiency; guidelines; maximum power point; measurement; multijunction solar cells; optimisation; quantum efficiency; simulation; sub-cell thickness; Color; Current measurement; Electric variables measurement; Identity-based encryption; Monitoring; Power conversion; Power measurement; Shape; Thickness measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347103
  • Filename
    347103