• DocumentCode
    2311165
  • Title

    Event-based fault detection of manufacturing cell: Data inconsistencies between academic assumptions and industry practice

  • Author

    Allen, L.V. ; Tilbury, D.M.

  • Author_Institution
    Depts. of Electr. Eng.: Syst. & Mech. Eng., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    21-24 Aug. 2010
  • Firstpage
    426
  • Lastpage
    432
  • Abstract
    Some problems with event-based faults in manufacturing systems cannot be handled by existing fault detection solutions, including finding faults in event-based data for systems for which limited information is known. A new fault detection solution that finds faults in event-based data using model generation is presented here. This solution assumes that some information is known about the system from its design information and data structure. An example application of this solution is presented for a Ford machining cell that has been experiencing a gantry waiting problem. In the course of this example application, five inconsistencies were found between relatively common academic assumptions made by this fault detection solution (as well as others) and the actual cell´s set-up and data. These inconsistencies and possible means of addressing them are discussed. Some of these means to resolve the inconsistencies have been implemented, and preliminary results in generating models using the fault detection solution are presented.
  • Keywords
    automobile industry; cellular manufacturing; data structures; design engineering; fault diagnosis; machining; Ford machining cell; academic assumptions; data inconsistency; data structure; design information; event-based fault detection; gantry waiting problem; industry practice; manufacturing cell; manufacturing system; model generation; Computer numerical control; Fault detection; Industries; Loading; Machining; Manufacturing systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2010 IEEE Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-5447-1
  • Type

    conf

  • DOI
    10.1109/COASE.2010.5584595
  • Filename
    5584595