• DocumentCode
    2311282
  • Title

    Design of a high fill-factor micromachined bolometer for thermal imaging applications

  • Author

    Safy, M. ; Zaky, A. Hafz

  • Author_Institution
    Dept. of Electron., Mil. Tech. Coll., Egypt
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper reports a novel design of a microchined bolometer for thermal imaging applications. The thermal modeling and stress analysis of infrared radiation bolometer which is made of a thin film of aSi:H has been performed using FLUENT(6.1) and ANSYS (11) CFD programs respectively. This bolometer is realized in a multilevel electro thermal structure having a high fill factor. Using the multilevel structure, thermal isolation can be independently optimized without sacrificing the IR absorption area. The analysis showed that optimization of the arm dimensions can be done without failure of structure breakdown or buckling. The design shows that the thermal time constant is 12.95 ms, the responsivity is of 4.65×103 V/W, and the detcetivity is of 7.97×108 cm Hz1/2 w-1 which can be achieved in a 50μm×50μm michromachined structure.
  • Keywords
    amorphous semiconductors; bolometers; buckling; infrared detectors; infrared imaging; optimisation; semiconductor thin films; stress analysis; buckling; fill factor; infrared radiation bolometer; micromachined bolometer; optimization; size 50 mum; stress analysis; structure breakdown; thermal imaging; thermal isolation; thermal modeling; thin film; time 12.95 ms; Amorphous silicon; Bolometers; Computational fluid dynamics; Detectors; Films; Stress; Bolometer-Infreared-Thermal modeling; Stress Analysis-Micromachined-Detectors-FEA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699494
  • Filename
    5699494