• DocumentCode
    2311377
  • Title

    Raman, photoluminescence, and SEM studies of CdS and CdTe films grown by RF sputtering and laser physical vapor deposition

  • Author

    Bohn, Randy G. ; Li, Yuxin ; Shao, Meilun ; Tabory, Charles N. ; Feng, Zhirong ; Fischer, Andreas ; Compaan, Alvin D.

  • Author_Institution
    Dept. of Phys. & Astron., Toledo Univ., OH, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    510
  • Lastpage
    515
  • Abstract
    Polycrystalline films of CdS, CdTe, as well as CdS/CdTe heterojunctions grown by RF magnetron sputtering and by pulsed laser physical vapor deposition are studied using the techniques of SEM, photoluminescence (PL), and Raman scattering. By correlating grain sizes and spectral features we have been able to optimize growth temperatures. Optical studies of the buried heterojunction and the spectral response of the cell have led to optimization of post-growth anneal times and layer thicknesses
  • Keywords
    CVD coatings; II-VI semiconductors; Raman spectra of inorganic solids; cadmium compounds; p-n heterojunctions; photoluminescence; scanning electron microscope examination of materials; semiconductor growth; semiconductor thin films; solar cells; sputtered coatings; CdS films; CdS-CdTe; CdS/CdTe heterojunctions; CdTe films; RF sputtering; Raman scattering; SEM; buried heterojunction; grain sizes; laser physical vapor deposition; layer thicknesses; optical studies; photoluminescence; polycrystalline films; post-growth anneal times; solar cells; spectral features; Chemical vapor deposition; Heterojunctions; Laser theory; Optical films; Optical pulses; Photoluminescence; Pulsed laser deposition; Radio frequency; Raman scattering; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347128
  • Filename
    347128