DocumentCode
2311378
Title
Pairwise Testing in the Presence of Configuration Change Cost
Author
Kimoto, Shin ; Tsuchiya, Tatsuhiro ; Kikuno, Tohru
Author_Institution
Osaka Univ., Suita
fYear
2008
fDate
14-17 July 2008
Firstpage
32
Lastpage
38
Abstract
Testing is an important but expensive part of software development. This paper discusses the minimization of testing cost in the presence of configuration change cost. By configuration change cost we mean the cost of configuration changes that occur in sequential testcase execution - the time and effort incurred in changing the configuration if the execution of two consecutive testcases requires different system configurations. To the best of our knowledge this problem has never been studied before. We tackle the problem in the context of pairwise testing, a well-known testing strategy for black box testing. This strategy requires that all possible pairs of input parameters be covered by at least one testcase. Extending a greedy algorithm, we develop two algorithms for constructing pairwise test suites of both small size and low configuration change cost.
Keywords
configuration management; cost reduction; greedy algorithms; minimisation; program testing; software engineering; black box testing; configuration change cost; greedy algorithm; pairwise testing; sequential testcase execution; software development; testing cost minimization; Cost function; Greedy algorithms; Minimization methods; Programming; Sequential analysis; Software systems; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location
Yokohama
Print_ISBN
978-0-7695-3266-0
Electronic_ISBN
978-0-7695-3266-0
Type
conf
DOI
10.1109/SSIRI.2008.27
Filename
4579791
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