• DocumentCode
    2311388
  • Title

    Design, implementation, and test for a 3D-IC many-core processor

  • Author

    Lee, Hsien-Hsin S.

  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    31
  • Keywords
    design for testability; energy consumption; integrated circuit design; integrated circuit testing; microprocessor chips; three-dimensional integrated circuits; 3D integration; 3D stacked architecture physical design; 3D-IC many-core processor; 3D-MAPS fabrication; 3D-MAPS prototyping; Georgia Tech; design for testability; energy consumption; latency; research scope; wirelength reduction; Delay; Optical devices; Radio frequency; Random access memory; System-on-a-chip; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699501
  • Filename
    5699501