Title :
The effects of Cd/Te mole ratio in the MOCVD growth ambient on CdTe solar cells
Author :
Chou, H.C. ; Bhat, A.K. ; Kamra, S. ; Rohatgi, A. ; Arya, R.R. ; Russel, L. ; Ahrenkiel, R.K.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
CdTe/CdS solar cells were fabricated by depositing CdTe films on glass/SnO2/CdS substrates by MOCVD in different growth ambients with varying Te/Cd mole ratios in the range of 0.02 to 15. Short circuit current density (Jsc) showed a minimum at Te/Cd ratio of 0.1 and increased on both sides of this minimum giving rise to a “U” shaped curve. Open circuit voltage (Voc) was highest for the Te-rich growth ambient and was low for the stoichiometric and the Cd-rich growth conditions. Such variations in J sc and Voc gave the best cell efficiency of 12% in this study at a Te/Cd ratio of six. The films grown under Te-rich conditions form p-type CdTe, but the Cd-rich growth conditions produce n-type CdTe which require 400°C/air anneal for the type conversion. Detailed measurements and analysis revealed a high degree of atomic interdiffusion at the interface when the CdTe films were grown in the Te-rich conditions. The enhanced interdiffusion reduces interface states which is further supported by higher effective lifetime in the Te-rich films, as well as rapid decrease in quantum efficiency under forward bias for the Cd-rich cells
Keywords :
CVD coatings; II-VI semiconductors; cadmium compounds; chemical vapour deposition; p-n heterojunctions; semiconductor device models; semiconductor device testing; semiconductor growth; semiconductor thin films; solar cells; 12 percent; 400 C; CdTe-CdS; MOCVD growth; analysis; atomic interdiffusion; current density; deposition; fabrication; forward bias; interface; lifetime; measurements; mole ratio; open circuit voltage; quantum efficiency; semiconductors; short circuit current; solar cells; substrates; Annealing; Atomic measurements; Cadmium compounds; Glass; MOCVD; Optical films; Photovoltaic cells; Substrates; Surface treatment; Tellurium;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347134