• DocumentCode
    2311490
  • Title

    Shortening Test Case Execution Time for Embedded Software

  • Author

    Santiago, Valdivino ; Silva, Wendell P. ; Vijaykumar, N.L.

  • Author_Institution
    Nat. Inst. for Space Res., Sao Jose dos Campos
  • fYear
    2008
  • fDate
    14-17 July 2008
  • Firstpage
    81
  • Lastpage
    88
  • Abstract
    Cost-effectiveness is perhaps the most driving characteristic behind a test automation approach aiming to spend less time in testing a software and finding as many faults as possible. Many research papers have been addressing the automation of test case generation activity by means of models, methods, tools and frameworks. However, in a practical software development environment it is not reasonable to automate test case generation if it is not possible to automatically execute them stimulating the software and capturing actual results. This paper presents the results obtained by using a tool, QSEE-TAS, that automates both test execution and test process documentation generation. It also presents the main features of such a tool. Three different embedded software products for computers of scientific experiments of satellites under development at National Institute for Space Research (INPE) were selected for showing the usefulness of QSEE-TAS compared with previous testing execution tools used at INPE.
  • Keywords
    embedded systems; program testing; software engineering; system recovery; National Institute for Space Research; embedded software products; execution tools; software development environments; test case execution time; test process documentation generation; Aerospace electronics; Application software; Automatic testing; Automation; Embedded software; Programming; Software quality; Software testing; Software tools; System testing; Automated Software Testing; Embedded Software; Test Case Execution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-0-7695-3266-0
  • Electronic_ISBN
    978-0-7695-3266-0
  • Type

    conf

  • DOI
    10.1109/SSIRI.2008.49
  • Filename
    4579798