• DocumentCode
    2311559
  • Title

    Interface engineering between CuInSe2 and ZnO

  • Author

    Kessler, J. ; Ruckh, M. ; Hariskos, D. ; Ruhle, U. ; Menner, Richard ; Schock, H.W.

  • Author_Institution
    Inst. fur Phys. Elektronik, Stuttgart Univ., Germany
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    447
  • Lastpage
    452
  • Abstract
    In this contribution the interest is centered on interaction phenomena that occur between the CuInSe2, the chemical bath deposition (CBD) used to grow buffer layers and the RF sputtered ZnO windows. The potential output of a better understanding of these interfacial aspects is to permit high quality device synthesis, not only without the use of Cd, but without the need of interrupting the vacuum processing between the absorber and the window synthesis. Direct CuInSe 2/ZnO structures are optimized here to be 10.5% efficient, limited only by their low (less than 400 mV) open circuit voltages. Different methods were explored to try to overcome these limiting mechanisms and attempts were made using jV(T) analysis to identify them. The Voc can be improved by the use of (CBD) buffer layers, well known for CdS but also true for a list of other materials. The reasons for such results are possibly at the interfacial chemistry level
  • Keywords
    II-VI semiconductors; coating techniques; copper compounds; indium compounds; interface structure; semiconductor growth; semiconductor junctions; semiconductor thin films; sputter deposition; sputtered coatings; ternary semiconductors; zinc compounds; CuInSe2; CuInSe2-ZnO; CuInSe2ZnO structures; RF sputtered ZnO windows; buffer layers growth; chemical bath deposition; Annealing; Buffer layers; Chemistry; Computational Intelligence Society; Conductivity; Plasma devices; Plasma materials processing; Radio frequency; Sputtering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347140
  • Filename
    347140