• DocumentCode
    2311567
  • Title

    Slow Control System for a NEXT-TPC prototype

  • Author

    Gil, A. ; Ball, M. ; Cárcel, S. ; Díaz, J. ; Yahlali, N.

  • Author_Institution
    Inst. de Fis. Corpuscular, CSIC-Univ. de Valencia, Valencia, Spain
  • fYear
    2009
  • fDate
    10-15 May 2009
  • Firstpage
    110
  • Lastpage
    112
  • Abstract
    NEXT is a double beta decay experiment that will be installed in Canfranc Underground Laboratory. The precise monitoring of a number of variables such as temperatures, relative and absolute pressure, gas flows, high voltage, etc is required for the proper operation of the detector and to perform the adequate data corrections. For this purpose a complete Slow Control System using LabVIEW has been developed and is now under operation for TPC studies and characterization. Each sensor can be connected to a main PLC (Programmable Logic Controller) with Ethernet. The PLC provides modularity and allows the increase of the number of sensors if needed, while the Ethernet port is a flexible interface for remote control and monitoring.
  • Keywords
    control engineering computing; double beta decay; flow control; high energy physics instrumentation computing; local area networks; pressure control; programmable controllers; telecontrol; temperature control; time projection chambers; Canfranc Underground Laboratory; Ethernet; LabVIEW; NEXT-TPC prototype; absolute pressure monitoring; double beta decay experiment; flexible interface; gas flow monitoring; high voltage monitoring; programmable logic controller; relative pressure monitoring; remote control; remote monitoring; slow control system; temperature monitoring; Control systems; Ethernet networks; Fluid flow; Laboratories; Monitoring; Programmable control; Prototypes; Radioactive decay; Sensor phenomena and characterization; Temperature sensors; NEXT; gas sensors; monitoring systems; slow control system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real Time Conference, 2009. RT '09. 16th IEEE-NPSS
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4454-0
  • Type

    conf

  • DOI
    10.1109/RTC.2009.5322144
  • Filename
    5322144