DocumentCode
2311624
Title
Model-based control of a copper micro plating process
Author
Marschner, U. ; Hoffmann, J. ; Sadowski, G. ; Hoffmann, T. ; Fischer, W.-J.
Author_Institution
Semicond. & Mikrosyst. Technol. Lab., Tech. Univ. Dresden, Germany
Volume
1
fYear
1998
fDate
1-4 Sep 1998
Firstpage
491
Abstract
The monitoring of a copper micro plating process by parameter estimation is investigated. The basis of the parameter estimation is a mathematical model of the relationship between electrical current density and potential which includes new approximations and which depends nonlinear on the parameters. The estimated parameters are used to adjust the copper micro plating process. In the first part of the paper the process is explained and the mathematical model including new approximations is presented. In the second part this model is used to estimate process parameters and results of measurement fits are shown followed by a conclusion
Keywords
condition monitoring; copper micro plating process; electrical current density; measurement fits; model-based control;
fLanguage
English
Publisher
iet
Conference_Titel
Control '98. UKACC International Conference on (Conf. Publ. No. 455)
Conference_Location
Swansea
ISSN
0537-9989
Print_ISBN
0-85296-708-X
Type
conf
DOI
10.1049/cp:19980278
Filename
727971
Link To Document