• DocumentCode
    2311624
  • Title

    Model-based control of a copper micro plating process

  • Author

    Marschner, U. ; Hoffmann, J. ; Sadowski, G. ; Hoffmann, T. ; Fischer, W.-J.

  • Author_Institution
    Semicond. & Mikrosyst. Technol. Lab., Tech. Univ. Dresden, Germany
  • Volume
    1
  • fYear
    1998
  • fDate
    1-4 Sep 1998
  • Firstpage
    491
  • Abstract
    The monitoring of a copper micro plating process by parameter estimation is investigated. The basis of the parameter estimation is a mathematical model of the relationship between electrical current density and potential which includes new approximations and which depends nonlinear on the parameters. The estimated parameters are used to adjust the copper micro plating process. In the first part of the paper the process is explained and the mathematical model including new approximations is presented. In the second part this model is used to estimate process parameters and results of measurement fits are shown followed by a conclusion
  • Keywords
    condition monitoring; copper micro plating process; electrical current density; measurement fits; model-based control;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Control '98. UKACC International Conference on (Conf. Publ. No. 455)
  • Conference_Location
    Swansea
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-708-X
  • Type

    conf

  • DOI
    10.1049/cp:19980278
  • Filename
    727971