• DocumentCode
    2311659
  • Title

    Electrochemical corrosion and oxidation behaviors of high temperature Pb-free solders

  • Author

    Tsai, Chi-Hang ; Cheng, Yun-Min ; Song, Jenn-Ming

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Dong Hwa Univ., Hailien, Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study aimed to investigate the corrosion resistance in 3.5%NaCl solution and high temperature oxidation behavior of Pb-5Sn solder and its alternatives under development, Bi-11Ag and Zn-40Sn. Compared with Pb-5Sn and Zn-40Sn, Bi-11Ag exhibited higher corrosion potential and relatively low corrosion current density. The ductile Ag-rich phase which dispersed in the Bi matrix was able to accommodate the stress arising from the formation of a passive layer and contributed to the two-stage passivation. X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) results confirm that the corrosion products comprised BiOCl, Bi2O3 and AgCl. Among the die-attach solders investigated, the Zn-Sn alloys exhibit a superior oxidation resistance. Pb and Bi based alloys possess inferior protection function in the liquid state. The additions of Ag can significantly reduce the oxidation of Bi and thus Bi-llAg has a comparable performance with Pb-5Sn. The thin layer of the oxides of Zn protects the liquid solder from oxidation, because ZnO is thermodynamically stable and tends to slow down further oxidation as indicated by the kinetics data (the rate constant and activation energy).
  • Keywords
    X-ray diffraction; X-ray photoelectron spectra; bismuth alloys; corrosion resistance; current density; electrochemistry; oxidation; passivation; solders; tin alloys; zinc alloys; Bi-Ag; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; Zn-Sn; activation energy; corrosion current density; corrosion potential; corrosion resistance; ductile silver-rich phase; electrochemical corrosion; high temperature lead-free solders; oxidation resistance; two-stage passivation; Bismuth; Corrosion; Films; Oxidation; Passivation; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699517
  • Filename
    5699517