DocumentCode
2311683
Title
Analysis of losses in high-efficiency CdTe cells
Author
Liu, X.X. ; Eisgruber, I.L. ; Sites, J.R.
Author_Institution
Dept. of Phys., Colorado State Univ., Fort Collins, CO, USA
fYear
1993
fDate
10-14 May 1993
Firstpage
405
Lastpage
408
Abstract
High-efficiency (⩾15%) CdTe solar cells, fabricated at the University of South Florida, show favorable features in their diode junction characteristics. At any selected voltage, forward current is smaller than that reported for other CdTe cells. Variable-intensity measurements show the diode quality factor A increases gradually between 0 and 100 mW/cm2, and is less at operating intensities than seen in other cells to date. Series and shunt resistances decrease continuously with intensity, but most of the decrease occurs below 10 mW/cm2. Temperature dependent measurements show a 1.8 mV/K decrease in the open-circuit voltage and an approximate 1.4 V zero-temperature extrapolation. The difference between the translated light curve and dark curve in the operating range is 50 mV at higher temperatures and 70 mV at lower ones. Examination of several cells over a 3-month period shows the elimination of an increase in series resistance seen in the previous highest-efficiency cell
Keywords
II-VI semiconductors; cadmium compounds; losses; p-n homojunctions; semiconductor device testing; solar cells; 1.4 V; 3 month; CdTe; dark curve; diode junction characteristics; diode quality factor; fabrication; high-efficiency; light curve; losses; open-circuit voltage; semiconductor; series resistance; shunt resistance; solar cells; temperature dependent measurements; variable-intensity measurements; zero-temperature extrapolation; Current measurement; Current-voltage characteristics; Diodes; Electrical resistance measurement; Lighting; Photoconductivity; Photovoltaic cells; Q factor; Temperature measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location
Louisville, KY
Print_ISBN
0-7803-1220-1
Type
conf
DOI
10.1109/PVSC.1993.347148
Filename
347148
Link To Document