DocumentCode
2311732
Title
The control way of solder blister as plating machine breakdown
Author
Lee, Chen-Hung ; Lin, Lu-Fu ; Ho, Tsung-Han ; Cheng, Shi-Shiun ; Chen, Jian-Wen ; Tu, Hung-Hsu
Author_Institution
Dept. of Chem. & Mater. Eng., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
Tin plating of lead frame packages has been driven into the market to meet Green requirements. To avoid tin whiskers issue, Sn-Cu and Sn-Bi are the other option in stead of pure Tin plating. Copper oxidation will give rise solder blisters if machine breakdown during Sn-Cu plating process for lead frame packages. The poor contacts resulted in contact area due to copper oxidization which in turn caused the solder blisters. During SMT process such as components onto Printed Circuit Boards, solder blister caused solder bridging was found. This study shows that solder blisters will occur when the metal ions deposit in an irregular due to copper ion oxidization if plating machine breakdown. The gap between plating layers is growing during the reflow process, and is causing blisters. The paper will not focus on the study of performance of the type of organic additive, but is to study how long plating machine breakdown will cause solder blister because it is a very important control item for Sn-Cu plating process.
Keywords
bismuth alloys; copper alloys; electroplating; oxidation; printed circuits; reflow soldering; solders; surface mount technology; tin alloys; SMT process; Sn-Bi; Sn-Cu; copper ion oxidization; green requirements; lead frame packages; plating machine breakdown; printed circuit boards; pure tin plating; reflow process; solder blister; solder bridging; Chemicals; Copper; Electric breakdown; Inspection; Lead; Tin; Visualization; Conditioner; Organic additive; Oxidization; Solder Blister; Solder bridging;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699522
Filename
5699522
Link To Document