DocumentCode
2311822
Title
The stress-strain relationship of Sn63Pb37 and SAC305 solder materials at elevated temperature condition
Author
Jenq, Syh-Tsang ; Chiu, Yuen-Sheng ; Lin, Ren-Jey ; Lai, Yi-Shao
Author_Institution
Dept. of Aeronaut. & Astronaut., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
This paper is emphasized on the compression behavior of Sn-3Ag-0.5Cu (SAC305) and Sn-37Pb at elevated temperatures. The effect of temperature for Sn-3Ag-0.5Cu (SAC305) and Sn-37Pb alloys was also discussed. The Quasi-static compression test was also conducted by using the SHIMAZDU AG-X material testing machine and the loading rare was chosen to be 1.67×10-3 s-1 and 1.67×10-4 s-1. Moreover, heating oven was utilized to control the specific temperatures (approximately 30°C, 60°C and 90°C), and the corresponding K-type digital thermometer was used to record the temperature during the tests. According to the several strain-rate ranges studied, the limited strain-rate hardening effect for these alloys studied were reported. In addition, the effect of elevated temperature on the solder material softening was also presented. The test determined saturation stresses were also presented for both Sn-3Ag-0.5Cu (SAC305) and Sn-37Pb solders, and relationship among the saturation stresses, strain-rate hardening and material soften is discussed.
Keywords
heating; lead alloys; solders; stress-strain relations; temperature control; thermometers; tin alloys; K-type digital thermometer; SAC305 solder material; SHIMAZDU AG-X material testing machine; Sn-37Pb alloys; Sn-Ag-Cu; Sn-Pb; Sn63Pb37 solder material; compression behavior; heating oven; loading rare; quasi-static compression test; saturation stress; solder material softening; strain-rate hardening effect; stress-strain relationship; temperature control; temperature recording; Heating; Loading; Materials; Softening; Strain; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699529
Filename
5699529
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