DocumentCode :
2312036
Title :
Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches
Author :
Nakao, Haruka ; Eschbach, Robert
Author_Institution :
S & PA Div., Japan Manned Space Syst. Corp., Tokyo
fYear :
2008
fDate :
14-17 July 2008
Firstpage :
213
Lastpage :
214
Abstract :
Model-based testing is used as a cost-effective development approach especially for embedded systems in the automotive sector. In this work, we focus on two kinds of test case generation and compare two methods. Each method has different criteria for generating test cases: One is based on the theory of Markov chains and the other one is a combination of functions to get test cases for unexpected failure. We compared two sets of test cases from the two test case generation methods and show that combining the two methods makes model-based testing more cost-effective in the context of critical embedded systems. The work presented in this paper is work in progress.
Keywords :
Markov processes; embedded systems; formal specification; program testing; statistical testing; Markov chains; cost-effective development approach; critical embedded systems; model-based testing; strategic usage; test case generation; Automatic testing; Automotive engineering; Context modeling; Embedded system; Probability; Safety; Software systems; Software testing; Statistical analysis; System testing; Formal model; Model based testing; Software Requirement Specification; Statistical Testing; System test; Taguchi-Method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-0-7695-3266-0
Electronic_ISBN :
978-0-7695-3266-0
Type :
conf
DOI :
10.1109/SSIRI.2008.17
Filename :
4579830
Link To Document :
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