DocumentCode
2312036
Title
Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches
Author
Nakao, Haruka ; Eschbach, Robert
Author_Institution
S & PA Div., Japan Manned Space Syst. Corp., Tokyo
fYear
2008
fDate
14-17 July 2008
Firstpage
213
Lastpage
214
Abstract
Model-based testing is used as a cost-effective development approach especially for embedded systems in the automotive sector. In this work, we focus on two kinds of test case generation and compare two methods. Each method has different criteria for generating test cases: One is based on the theory of Markov chains and the other one is a combination of functions to get test cases for unexpected failure. We compared two sets of test cases from the two test case generation methods and show that combining the two methods makes model-based testing more cost-effective in the context of critical embedded systems. The work presented in this paper is work in progress.
Keywords
Markov processes; embedded systems; formal specification; program testing; statistical testing; Markov chains; cost-effective development approach; critical embedded systems; model-based testing; strategic usage; test case generation; Automatic testing; Automotive engineering; Context modeling; Embedded system; Probability; Safety; Software systems; Software testing; Statistical analysis; System testing; Formal model; Model based testing; Software Requirement Specification; Statistical Testing; System test; Taguchi-Method;
fLanguage
English
Publisher
ieee
Conference_Titel
Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
Conference_Location
Yokohama
Print_ISBN
978-0-7695-3266-0
Electronic_ISBN
978-0-7695-3266-0
Type
conf
DOI
10.1109/SSIRI.2008.17
Filename
4579830
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