• DocumentCode
    2312036
  • Title

    Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches

  • Author

    Nakao, Haruka ; Eschbach, Robert

  • Author_Institution
    S & PA Div., Japan Manned Space Syst. Corp., Tokyo
  • fYear
    2008
  • fDate
    14-17 July 2008
  • Firstpage
    213
  • Lastpage
    214
  • Abstract
    Model-based testing is used as a cost-effective development approach especially for embedded systems in the automotive sector. In this work, we focus on two kinds of test case generation and compare two methods. Each method has different criteria for generating test cases: One is based on the theory of Markov chains and the other one is a combination of functions to get test cases for unexpected failure. We compared two sets of test cases from the two test case generation methods and show that combining the two methods makes model-based testing more cost-effective in the context of critical embedded systems. The work presented in this paper is work in progress.
  • Keywords
    Markov processes; embedded systems; formal specification; program testing; statistical testing; Markov chains; cost-effective development approach; critical embedded systems; model-based testing; strategic usage; test case generation; Automatic testing; Automotive engineering; Context modeling; Embedded system; Probability; Safety; Software systems; Software testing; Statistical analysis; System testing; Formal model; Model based testing; Software Requirement Specification; Statistical Testing; System test; Taguchi-Method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure System Integration and Reliability Improvement, 2008. SSIRI '08. Second International Conference on
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-0-7695-3266-0
  • Electronic_ISBN
    978-0-7695-3266-0
  • Type

    conf

  • DOI
    10.1109/SSIRI.2008.17
  • Filename
    4579830