• DocumentCode
    2312657
  • Title

    Self-referenced poly-Si TFT amplifier readout for a linear image sensor

  • Author

    Fujieda, I. ; Okumura, F. ; Sera, K. ; Asada, H. ; Sekine, H.

  • Author_Institution
    Functional Devices Res. Labs., NEC Corp., Kawasaki, Japan
  • fYear
    1993
  • fDate
    5-8 Dec. 1993
  • Firstpage
    587
  • Lastpage
    590
  • Abstract
    A readout scheme with thin film transistor (TFT) amplifier is proposed for a linear image sensor. Each pixel is provided with a TFT amplifier and additional TFT circuits which allow self-calibration of the amplifier. Prototype sensors were successfully fabricated by the low-temperature poly-Si process utilizing excimer laser annealing.<>
  • Keywords
    CMOS integrated circuits; calibration; image sensors; integrated circuit technology; laser beam annealing; nondestructive readout; thin film transistors; Si; excimer laser annealing; linear image sensor; low-temperature polysilicon process; polysilicon TFT amplifier; readout scheme; self-calibration; Circuits; Detectors; Image sensors; Laboratories; Optical amplifiers; Optical devices; Optical switches; Photodiodes; Prototypes; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-1450-6
  • Type

    conf

  • DOI
    10.1109/IEDM.1993.347234
  • Filename
    347234