DocumentCode
2312919
Title
Tunable internal photoemission sensor using silicide/silicon heterostructures
Author
Sagnes, I. ; Campidelli, Y. ; Chevalier, F. ; Badoz, P.A.
Author_Institution
CNET, France Telecom, Meylan, France
fYear
1993
fDate
5-8 Dec. 1993
Firstpage
912
Lastpage
914
Abstract
A new silicide/silicon IR detector is presented which has the potential for multicolor detection due to the tunability of its photoresponse and cutoff wavelength. This tunable internal photoemission sensor (TIPS) consists of two back-to-back Schottky diodes separated by a thin undoped Si layer. The two metals are chosen with different Schottky barrier heights so that the depleted Si forms an asymmetrical potential barrier to the carriers (both holes and electrons) photocreated in each metallic film. Under sub-band gap illumination the photocurrent flowing between the two metallic films is therefore strongly dependent on the shape and height of the potential barrier which can be varied by a small bias applied between the two metal electrodes.<>
Keywords
Schottky-barrier diodes; erbium compounds; infrared detectors; iridium; metallic thin films; optical sensors; photoemission; silicon; silicon compounds; Ir-Si-ErSi/sub 2/; Schottky barrier heights; Si-ErSi/sub 2/; asymmetrical potential barrier; back-to-back Schottky diodes; cutoff wavelength; depleted Si forms; electrons; holes; metal electrodes; metallic film; multicolor detection; photocreated; photocurrent flow; photoresponse; silicide/silicon IR detector; silicide/silicon heterostructures; small bias; sub-band gap illumination; thin undoped Si layer; tunability; tunable internal photoemission sensor; Charge carrier processes; Infrared detectors; Lighting; Photoconductivity; Photoelectricity; Schottky barriers; Schottky diodes; Semiconductor films; Silicides; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-1450-6
Type
conf
DOI
10.1109/IEDM.1993.347252
Filename
347252
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