DocumentCode
2313051
Title
Effective thermal management of multiple electronic components
Author
Yu, Chun Sheng ; Kang, Shung Wen ; Weng, Ming Tai
Author_Institution
Dept. of Mech. & Electro-Mech. Eng., Tamkang Univ., Tamsui, Taiwan
fYear
2010
fDate
20-22 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
The objective of this paper is to provide an effective and accurate analytical solution to compute the spreading thermal resistance of a vapor chamber thermal module, as well as the surface temperatures and the heat flux distributions at the heating surface. The analytical solutions are expressed in a reduced unit system with the governing parameters of the corresponding distance between heat sources, dimensionless plate thickness of the vapor chamber. This paper also presents vapor chamber temperature distribution, and it is correlation to heat source sizes, hence, spreading thermal resistance decreases with the increasing lateral length. There is the obvious difference between spreading thermal and conductive thermal resistance as lateral length is disproportion to heating area. Therefore, spreading thermal resistance is an important factor when design the thermal solution of a high density chipset power, and it caused high temperature in heat sources by embedded a thinner heat sink base. According to Fourier conductivity theorem, spreading thermal resistance is disproportion to sink base, then thermal resistance is not only parameter for vapor chamber module design, it needs to consider spreading resistance of vapor chamber and fin performance for cooling LEDs array, in order to prevent mismatch on numerical analysis and mathematical calculation. Thermal simulation is used as a design tool, and it is close to experimental data. The difference is within 5.9%, and it presents a precise result.
Keywords
heat transfer; numerical analysis; thermal management (packaging); thermal resistance; effective thermal management; heat flux distributions; mathematical calculation; multiple electronic components; numerical analysis; thermal resistance; thermal simulation; Heat sinks; Heat transfer; Light emitting diodes; Resistance heating; Thermal resistance; multiple heat sources; spreading thermal resistance; vapor chamber;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4244-9783-6
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2010.5699602
Filename
5699602
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