• DocumentCode
    2313074
  • Title

    Vision inspection system for holograms with mixed patterns

  • Author

    Park, Tae-Hyoung ; Kwon, Hyuk-Joong

  • Author_Institution
    Dept. of Control & Robot Eng., Chungbuk Nat. Univ., Cheongju, South Korea
  • fYear
    2010
  • fDate
    21-24 Aug. 2010
  • Firstpage
    563
  • Lastpage
    567
  • Abstract
    We propose an vision inspection system for hologram with mixed patterns. The system hardware consists of LED illuminator, CCD camera, and vision processor. The LEDs of illuminator emit alternatively and change the incident angle to acquire each image of pattern. The system software consists of the stages of pattern generation and pattern matching. The acquired images of hologram are compared with their reference images by matching algorithm. Since the several patterns are mixed in one hologram, the reference image should be changed if the hologram is rotated. To compensate for the positioning error of hologram, reference images are generated in on-line. We apply a frequency-transformation based CGH (computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results using holograms attached at Korean currency are then presented to verify the usefulness of the proposed system.
  • Keywords
    CCD image sensors; automatic optical inspection; computer vision; computer-generated holography; foreign exchange trading; light emitting diodes; pattern matching; CCD camera; Korean currency; LED illuminator; frequency-transformation based CGH method; frequency-transformation based computer-generated hologram method; matching algorithm; mixed patterns; pattern generation; pattern matching; reference images; vision inspection system; vision processor; Correlation; Frequency domain analysis; Inspection; Laser modes; Manganese; Pattern matching; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2010 IEEE Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-5447-1
  • Type

    conf

  • DOI
    10.1109/COASE.2010.5584721
  • Filename
    5584721